Ron Synowicki,: search on Z-Library

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1

SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Optical Metrology - Overview of variable-angle spectroscopic ellipsometry (VASE): I. Basic theory and typical applications

Woollam, John A., Johs, Blaine D., Herzinger, Craig M., Hilfiker, James N., Synowicki, Ron A., Bungay, Corey L.

Year:

2017

Language:

english

File:

PDF, 656 KB

english, 2017

2

Optical properties of soda-lime float glass from spectroscopic ellipsometry

Ron A. Synowicki, Blaine D. Johs, Andrew C. Martin

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 1.08 MB

english, 2011

3

Spectroscopic ellipsometry characterization of multilayer optical coatings

Hilfiker, James N., Pribil, Greg K., Synowicki, Ron, Martin, Andrew C., Hale, Jeffrey S.

Journal:

Surface and Coatings Technology

Year:

2018

Language:

english

File:

PDF, 3.97 MB

english, 2018

4

Progress in spectroscopic ellipsometry: Applications from vacuum ultraviolet to infrared

N. Hilfiker, James, Bungay, Corey L, Synowicki, Ron A., Tiwald, Thomas E., Herzinger, Craig M., Johs, Blaine, Pribil, Greg K., Woollam, John A.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2003

Language:

english

File:

PDF, 412 KB

english, 2003

5

Mueller matrix characterization of flexible plastic substrates

Hong, Nina, Synowicki, Ron A., Hilfiker, James N.

Journal:

Applied Surface Science

Year:

2017

Language:

english

File:

PDF, 4.07 MB

english, 2017

6

SPIE Proceedings [SPIE Critical Review Collection - Bellingham, United States (Friday 13 January 2017)] Optical Metrology: A Critical Review - Overview of variable-angle spectroscopic ellipsometry (VASE): II. Advanced applications

Johs, Blaine, Woollam, John A., Herzinger, Craig M., Hilfiker, James N., Synowicki, Ron A., Bungay, Corey L.

Year:

2017

Language:

english

File:

PDF, 675 KB

english, 2017

7

[ASCE CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY - Gaithersburg, Maryland (USA) (23-27 March 1998)] The 1998 international conference on characterization and metrology for ULSI technology - Metrology applications in lithography with variable angle spectroscopic ellipsometry

Hilfiker, James N., Carpio, Ron, Synowicki, Ron A., Woollam, John A.

Year:

1998

File:

PDF, 706 KB

1998

8

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Optical Microlithography XIII - Fluoropolymers for 157-nm lithography: optical properties from VUV absorbance and ellipsometry measurements

French, Roger H., Wheland, Robert C., Jones, David J., Hilfiker, James N., Synowicki, Ron A., Zumsteg, Jr., Fredrick C., Feldman, Jerald, Feiring, Andrew E., Progler, Christopher J.

Year:

2000

Language:

english

File:

PDF, 1.63 MB

english, 2000

9

SPIE Proceedings [SPIE Microlithography '97 - Santa Clara, CA, USA (Monday 10 March 1997)] Advances in Resist Technology and Processing XIV - Bleaching-induced changes in the dispersion curves of DNQ photoresists

Henderson, Clifford L., Tarascon-Auriol, Regine G., Willson, C. Grant, Dammel, Ralph R., Synowicki, Ron A.

Year:

1997

Language:

english

File:

PDF, 679 KB

english, 1997

10

Dynamic adsorption of albumin on nanostructured TiO2 thin films

Jennifer L. Wehmeyer, Ron Synowicki, Rena Bizios, Carlos D. García

Journal:

Materials Science and Engineering: C

Year:

2010

Language:

english

File:

PDF, 623 KB

english, 2010

11

SPIE Proceedings [SPIE 23rd Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 22 February 1998)] Metrology, Inspection, and Process Control for Microlithography XII - Refractive-index measurements of photoresist and antireflective coatings with variable angle spectroscopic ellipsometry

Synowicki, Ron A., Hilfiker, James N., Dammel, Ralph R., Henderson, Clifford L., Singh, Bhanwar

Year:

1998

Language:

english

File:

PDF, 445 KB

english, 1998

12

Volume measurements and fluorescent staining indicate an increase in permeability for organic cation transporter substrates during apoptosis

Gibbons, Brandon A., Kharel, Prakash, Robinson, Lauren C., Synowicki, Ron A., Model, Michael A.

Journal:

Experimental Cell Research

Year:

2016

Language:

english

File:

PDF, 2.11 MB

english, 2016

13

[IEEE 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) - Philadelphia, PA, USA (2009.06.7-2009.06.12)] 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) - Characterizing antireflection coatings on textured monocrystalline silicon with Spectroscopic Ellipsometry

Sun, Jianing, Saenger, Mario F., Schubert, Mathias, Hilfiker, James N., Ron Synowicki,, Herzinger, Craig M., Woollam, J. A.

Year:

2009

Language:

english

File:

PDF, 1.46 MB

english, 2009

14

The dielectric constant of PZT nanofiber at visible and NIR wavelengths

Galos, Richard, Shi, Yong, Ren, Zhongjing, Synowicki, Ron, Sun, Hao, Nykypanchuk, Dymtro, Su, Xiaoyu, Yuan, Jianping

Journal:

Nano-Structures & Nano-Objects

Year:

2017

Language:

english

File:

PDF, 1.57 MB

english, 2017

15

SPIE Proceedings [SPIE Microlithography 2000 - Santa Clara, CA (Sunday 27 February 2000)] Metrology, Inspection, and Process Control for Microlithography XIV - Optical characterization in the vacuum ultraviolet with variable angle spectroscopic ellipsometry: 157 nm and below

Hilfiker, James N., Singh, Bhanwar, Synowicki, Ron A., Bungay, Corey L., Sullivan, Neal T.

Year:

2000

Language:

english

File:

PDF, 334 KB

english, 2000

16

SPIE Proceedings [SPIE Microlithography '97 - Santa Clara, CA (Monday 10 March 1997)] Advances in Resist Technology and Processing XIV - Dependence of optical constants of AZ BARLi bottom coating on bake conditions

Dammel, Ralph R., Sagan, John P., Synowicki, Ron A., Tarascon-Auriol, Regine G.

Year:

1997

Language:

english

File:

PDF, 1.34 MB

english, 1997

17

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries - Variable angle spectroscopic ellipsometry in the vacuum ultraviolet

Woollam, John A., Hilfiker, James N., Tiwald, Thomas E., Bungay, Corey L., Synowicki, Ron A., Meyer, Duane E., Herzinger, Craig M., Pfeiffer, Galen L., Cooney, Gerald T., Green, Steven E., Al-Jumaily,

Year:

2000

Language:

english

File:

PDF, 1.21 MB

english, 2000

18

Rare-earth monopnictide alloys for tunable, epitaxial, designer plasmonics

Krivoy, Erica M., Vasudev, Alok P., Rahimi, Somayyeh, Synowicki, Ron A., McNicholas, Kyle Marshall, Ironside, Daniel J, Salas, Rodolfo, Kelp, Glen, Jung, Daehwan, Nair, Hari P., Shvets, Gannady, Akinw

Journal:

Year:

2018

Language:

english

File:

PDF, 1.51 MB

english, 2018

19

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Optical Microlithography XVII - Immersion fluid refractive indices using prism minimum deviation techniques

French, Roger H., Yang, Min K., Lemon, Michael F., Synowicki, Ron A., Pribil, Greg K., Cooney, Gerald T., Herzinger, Craig M., Green, Steven E., Burnett, John H., Kaplan, Simon G., Smith, Bruce W.

Year:

2004

Language:

english

File:

PDF, 336 KB

english, 2004

20

[ASCE CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY - Gaithersburg, Maryland (USA) (23-27 March 1998)] The 1998 international conference on characterization and metrology for ULSI technology - Metrology standards with ellipsometers

Woollam, John A., Hilfiker, James N., Herzinger, C. M., Synowicki, Ron A., Liphardt, M.

Year:

1998

Language:

english

File:

PDF, 1015 KB

english, 1998

21

Phononic and photonic properties of shape-engineered silicon nanoscale pillar arrays

Huang, Chun Yu, Kargar, Fariborz, Debnath, Topojit, Debnath, Bishwajit, Valentin, Michael D, Synowicki, Ron, Schoeche, Stefan, Lake, Roger K., Balandin, Alexander A

Journal:

Year:

2020

File:

PDF, 2.33 MB

2020

22

SPIE Proceedings [SPIE 1994 International Symposium on Optical Interference Coatings - Grenoble, France (Sunday 5 June 1994)] Optical Interference Coatings - Degradation of thin films in low earth orbit and comparisons with laboratory simulation

Spady, Blaine R., Abeles, Florin, Synowicki, Ron A., Hale, Jeff, DeVries, M. J., Ianno, Natale J., McGahan, William A., Woollam, John A.

Year:

1994

Language:

english

File:

PDF, 374 KB

english, 1994

23

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 6 October 2008)] Photomask Technology 2008 - Spectroscopic ellipsometry applications in photomask technology

Synowicki, Ron A., Kawahira, Hiroichi, Zurbrick, Larry S., Hilfiker, James N.

Year:

2008

Language:

english

File:

PDF, 354 KB

english, 2008

24

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Fiber Optic and Laser Sensors XIV - Self-calibrating modulation ellipsometer

Ducharme, Stephen, Machlab, Hassanayn, Snyder, Paul G., Woollam, John A., Synowicki, Ron A., DePaula, Ramon P., Berthold III, John W.

Year:

1996

Language:

english

File:

PDF, 1009 KB

english, 1996

25

Tape casting and characterizations of MgO ceramics

Chen, Ching-Fong, Baker, Timothy J., Synowicki, Ron, Tegtmeier, Eric L., Forsyth, Robert T., Bissell, Ashley L., Orlowski, Alex G., Christopher, James M., Savrun, Ender

Journal:

Journal of the American Ceramic Society

Year:

2020

File:

PDF, 1.04 MB

2020

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